Сибирский федеральный университет

Тип публикации: доклад, тезисы доклада, статья из сборника материалов конференций

Конференция: International Scientific Conference Reshetnev Readings 2016

Год издания: 2017

Идентификатор DOI: 10.1088/1757-899X/255/1/012015

Аннотация: The capabilities of transmission electron microscope Hitachi HT7700 for magnetic domain structure (MDS) study of thin films using Lorentz transmission electron microscopy (LTEM) methods is discussed. Two methods of magnetic domain structure study (defocus method and aperture shift method, including low-angle electron diffraction (LAED)) in thin magnetic films were examined. © 2017 Published under licence by IOP Publishing Ltd.

Журнал: IOP Conference Series: Materials Science and Engineering

Выпуск журнала: Vol. 255, Is. 1

Номера страниц: 12015

ISSN журнала: 17578981

Издатель: Institute of Physics Publishing

• Volochaev M.N. (Institute of Physics, Russian Academy of Sciences, Siberian Branch, Krasnoyarsk, Russian Federation, Reshetnev Siberian State University of Science and Technology, Krasnoyarsk, Russian Federation)
• Kveglis L.I. (Siberian Federal University, Krasnoyarsk, Russian Federation)
• Loginov Y.Y. (Reshetnev Siberian State University of Science and Technology, Krasnoyarsk, Russian Federation)

• Scopus
• Web of Science Core Collection
• Ядро РИНЦ (eLIBRARY.RU)