Тип публикации: статья из журнала
Год издания: 2017
Идентификатор DOI: 10.3103/S1062873817030388
Ключевые слова: Anisotropy, Deposition, Ferromagnetic materials, Film thickness, Nickel, Chemical deposition, Ferromagnetic thin films, Ni alloys, Ni thin films, Surface anisotropy, Wave resonances, Thin films
Аннотация: The effect the thickness and concentration composition of a ferromagnetic thin film have on surface anisotropy constant KS is investigated. Spin–wave resonance is chosen as a way of detecting and measuring the KS value. Fe–Ni thin films are synthesized via chemical deposition. Dependences of KS on the content of Ni in the alloy and a film’s thickness are established. © 2017, Allerton Press, Inc.
Издание
Журнал: Bulletin of the Russian Academy of Sciences: Physics
Выпуск журнала: Vol. 81, Is. 3
Номера страниц: 308-310
Персоны
- Vazhenina I.G. (Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, Russian Federation; Siberian Federal University, Krasnoyarsk, Russian Federation)
- Chekanova L.A. (Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, Russian Federation)
- Iskhakov R.S. (Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, Russian Federation)
Вхождение в базы данных
- Scopus
- Ядро РИНЦ (eLIBRARY.RU)
- Список ВАК
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