Сибирский федеральный университет

Тип публикации: статья из журнала

Год издания: 2017

Идентификатор DOI: 10.3103/S1062873817030388

Ключевые слова: Anisotropy, Deposition, Ferromagnetic materials, Film thickness, Nickel, Chemical deposition, Ferromagnetic thin films, Ni alloys, Ni thin films, Surface anisotropy, Wave resonances, Thin films

Аннотация: The effect the thickness and concentration composition of a ferromagnetic thin film have on surface anisotropy constant KS is investigated. Spin–wave resonance is chosen as a way of detecting and measuring the KS value. Fe–Ni thin films are synthesized via chemical deposition. Dependences of KS on the content of Ni in the alloy and a film’s thickness are established. © 2017, Allerton Press, Inc.

Журнал: Bulletin of the Russian Academy of Sciences: Physics

Выпуск журнала: Vol. 81, Is. 3

Номера страниц: 308-310

• Vazhenina I.G. (Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, Russian Federation; Siberian Federal University, Krasnoyarsk, Russian Federation)
• Chekanova L.A. (Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, Russian Federation)
• Iskhakov R.S. (Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, Russian Federation)

• Scopus
• Ядро РИНЦ (eLIBRARY.RU)
• Список ВАК