Сибирский федеральный университет

Тип публикации: статья из журнала (материалы конференций, опубликованные в журналах)

Год издания: 2011

Идентификатор DOI: 10.4028/www.scientific.net/SSP.168-169.261

Ключевые слова: Exchange bias effect, Magnetic properties, Ni and Ge mutual diffusion, Ni-Ge layer structures, Surface morphology, Antiferromagnetism, Diffusion, Germanium, Magnetization, Morphology, Phase interfaces, Solids, Nickel, Temperature distribution, Antiferromagnetic phase, Exchange bias effects, Ge films, Layered films, Low temperatures, Magnetization temperature, Mutual diffusion, Ge layers, Magnetism

Аннотация: The surface morphology and magnetic properties of layered Ni-Ge films were investigated. The films surface has been shown to consist of the grains of 2 - 4 nm in height with the average radius of about 40-80 nm. Magnetization temperature dependences are different for FC and ZFC processes; in the latter case, the magnetization maximum is observed near the temperature T m?50K. The exchange bias effect is observed at low temperatures. The results are explained by the formation of the antiferromagnetic phase in the interface between Ni and Ge layers due to the Ge and Ni mutual diffusion.

Журнал: Solid State Phenomena

Выпуск журнала: Vol. 168-169

Номера страниц: 261-264

• Chernichenko A.V. (Kirensky Institute of Physics,SB,RAS)
• Edelman I.S. (Kirensky Institute of Physics,SB,RAS)
• Velikanov D.A. (Siberian Federal University)
• Marushchenko D.A. (Siberian Federal University)
• Turpanov I.A. (Kirensky Institute of Physics,SB,RAS)
• Patrin G.S. (Siberian Federal University)
• Greben'kova Y.E. (Siberian Federal University)

• Scopus
• Web of Science Core Collection
• Ядро РИНЦ (eLIBRARY.RU)