Collective lattice resonances in all-dielectric nanostructures under oblique incidence | Научно-инновационный портал СФУ

Collective lattice resonances in all-dielectric nanostructures under oblique incidence

Тип публикации: статья из журнала

Год издания: 2020

Идентификатор DOI: 10.3390/PHOTONICS7020024

Ключевые слова: all-dielectric nanophotonics, collective lattice resonance, mie resonance, nanoparticle

Аннотация: Collective lattice resonances (CLRs) emerging under oblique incidence in 2D finite-size arrays of Si nanospheres have been studied with the coupled dipole model. We show that hybridization between the Mie resonances localized on a single nanoparticle and angle-dependent grating Wood-Rayleigh anomalies allows for the efficient tuning of CLRs across the visible spectrum. Complex nature of CLRs in arrays of dielectric particles with both electric dipole (ED) and magnetic dipole (MD) resonances paves a way for a selective and flexible tuning of either ED or MD CLR by an appropriate variation of the angle of incidence. The importance of the finite-size effects, which are especially pronounced for CLRs emerging for high diffraction orders under an oblique incidence has been also discussed. © 2020 by the authors.

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Издание

Журнал: Photonics

Выпуск журнала: Vol. 7, Is. 2

ISSN журнала: 23046732

Персоны

  • Utyushev A.D. (Department of Engineering Physics and Radioelectronics, Siberian Federal University, Krasnoyarsk, 660041, Russian Federation, Department of Space Materials and Technology, Siberian State University of Science and Technology, Krasnoyarsk, 660014, Russian Federation, Institute of Computational Modeling SB RAS, Krasnoyarsk, 660036, Russian Federation)
  • Zakomirnyi V.I. (Department of Engineering Physics and Radioelectronics, Siberian Federal University, Krasnoyarsk, 660041, Russian Federation, Institute of Computational Modeling SB RAS, Krasnoyarsk, 660036, Russian Federation)
  • Ershov A.E. (Department of Engineering Physics and Radioelectronics, Siberian Federal University, Krasnoyarsk, 660041, Russian Federation, Department of Space Materials and Technology, Siberian State University of Science and Technology, Krasnoyarsk, 660014, Russian Federation, Institute of Computational Modeling SB RAS, Krasnoyarsk, 660036, Russian Federation)
  • Gerasimov V.S. (Department of Engineering Physics and Radioelectronics, Siberian Federal University, Krasnoyarsk, 660041, Russian Federation, Institute of Computational Modeling SB RAS, Krasnoyarsk, 660036, Russian Federation)
  • Karpov S.V. (Department of Engineering Physics and Radioelectronics, Siberian Federal University, Krasnoyarsk, 660041, Russian Federation, Department of Space Materials and Technology, Siberian State University of Science and Technology, Krasnoyarsk, 660014, Russian Federation, L. V. Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, 660036, Russian Federation)
  • Rasskazov I.L. (The Institute of Optics, University of Rochester, Rochester, NY 14627, United States)

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