Сибирский федеральный университет

Тип публикации: статья из журнала

Год издания: 2019

Идентификатор DOI: 10.1134/S0021364019150098

Аннотация: A method for processing of in situ spectral magneto-ellipsometry data has been developed to analyze planar ferromagnetic nanostructures. A multilayer model containing a ferromagnetic layer with two interfaces, a nonferromagnetic buffer layer, and a nonfer A method for processing of in situ spectral magneto-ellipsometry data has been developed to analyze planar ferromagnetic nanostructures. A multilayer model containing a ferromagnetic layer with two interfaces, a nonferromagnetic buffer layer, and a nonferromagnetic substrate has been tested within a new approach to the interpretation of magnetic-field-modulated spectral ellipsometric measurements involving the magnetooptical Kerr effect in the transverse configuration. In particular, the effect of the thickness of the ferromagnetic layer on the results of magneto-ellipsometric measurements has been analyzed. The measurements have been performed with polycrystalline Fe films with different thicknesses on a nonferromagnetic SiO2/Si(100) surface. The diagonal and off-diagonal components of the complex dielectric tensor in the spectral range of 1.38–3.45 eV have been determined by processing spectral magneto-ellipsometric data. The results have been compared to the available data obtained by other authors and to the calculation of the dielectric tensor of Fe within the density functional theory. © 2019, Pleiades Publishing, Inc.

Журнал: JETP LETTERS

Выпуск журнала: Vol. 110, Is. 3

Номера страниц: 166-172

ISSN журнала: 00213640

Место издания: NEW YORK

Издатель: MAIK NAUKA/INTERPERIODICA/SPRINGER

• Maximova O.A. (Russian Acad Sci, Siberian Branch, Fed Res Ctr KSC, Kirensky Inst Phys, Krasnoyarsk 660036, Russia; Siberian Fed Univ, Krasnoyarsk 660041, RussiaArticle)
• Lyaschenko S.A. (Russian Acad Sci, Siberian Branch, Fed Res Ctr KSC, Kirensky Inst Phys, Krasnoyarsk 660036, Russia)
• Vysotin M.A. (Russian Acad Sci, Siberian Branch, Fed Res Ctr KSC, Kirensky Inst Phys, Krasnoyarsk 660036, Russia; Siberian Fed Univ, Krasnoyarsk 660041, RussiaArticle)
• Tarasov I.A. (Russian Acad Sci, Siberian Branch, Fed Res Ctr KSC, Kirensky Inst Phys, Krasnoyarsk 660036, Russia)
• Yakovlev I.A. (Russian Acad Sci, Siberian Branch, Fed Res Ctr KSC, Kirensky Inst Phys, Krasnoyarsk 660036, Russia)
• Shevtsov D.V. (Russian Acad Sci, Siberian Branch, Fed Res Ctr KSC, Kirensky Inst Phys, Krasnoyarsk 660036, Russia)
• Fedorov A.S. (Russian Acad Sci, Siberian Branch, Fed Res Ctr KSC, Kirensky Inst Phys, Krasnoyarsk 660036, Russia; Siberian Fed Univ, Krasnoyarsk 660041, RussiaArticle)
• Varnakov S.N. (Russian Acad Sci, Siberian Branch, Fed Res Ctr KSC, Kirensky Inst Phys, Krasnoyarsk 660036, Russia)
• Ovchinnikov S.G. (Russian Acad Sci, Siberian Branch, Fed Res Ctr KSC, Kirensky Inst Phys, Krasnoyarsk 660036, Russia; Siberian Fed Univ, Krasnoyarsk 660041, RussiaArticle)

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