Сибирский федеральный университет

Тип публикации: статья из журнала

Год издания: 2021

Идентификатор DOI: 10.1007/s10853-021-06206-4

Аннотация: Nowadays, the technical advances call for efficient electromagnetic interference (EMI) shielding of transparent devices which may be subject to data theft. We developed Cu-Ag and Ni-Ag meshes on flexible PET substrate for highly efficiency transparent EMI shielding coating. Cu-Ag and Ni-Ag meshes obtained with galvanic deposition of copper and nickel on thin Ag seed mesh which was made by cracked template method. Coefficients S-11, S-21 and shielding efficiency (SE) were measured for Cu-Ag and Ni-Ag meshes in X-band (8-12 GHz) and K-band (18-26.5 GHz). 90 s copper deposition increase SE from 23.2 to 43.7 dB at 8 GHz with a transparency of 82.2% and a sheet resistance of 0.25 Omega/sq. The achieved maximum SE was 47.6 dB for Cu-Ag mesh with 67.8% transparency and 41.1 dB for Ni-Ag mesh with 77.8% transparency. Cu-Ag and Ni-Ag meshes have high bending and long-term stability. Minimum bend radius is lower than 100 mu m. This effect allows to produce different forms of transparent shielding objects, for example, origami method. Our coatings are the leading among all literary solutions in three-dimensional coordinates: of sheet resistance-optical transmittance-cost of produced. [GRAPHICS] .

Журнал: JOURNAL OF MATERIALS SCIENCE

Выпуск журнала: Vol. 56, Is. 26

Номера страниц: 14741-14762

ISSN журнала: 00222461

Место издания: NEW YORK

Издатель: SPRINGER

• Voronin A.S. (Russian Acad Sci, Siberian Branch, Krasnoyarsk Sci Ctr, Fed Res Ctr,FRC KSC SB RAS, Krasnoyarsk 660036, Russia; Siberian Fed Univ, Krasnoyarsk 660041, Russia)
• Fadeev Y.V. (Russian Acad Sci, Siberian Branch, Krasnoyarsk Sci Ctr, Fed Res Ctr,FRC KSC SB RAS, Krasnoyarsk 660036, Russia)
• Govorun I.V. (Russian Acad Sci, Siberian Branch, Kirensky Inst Phys, Krasnoyarsk 660036, Russia; Reshetnev Univ, Reshetnev Siberian State Univ Sci & Technol, Krasnoyarsk 660037, Russia)
• Podshivalov I.V. (Russian Acad Sci, Siberian Branch, Kirensky Inst Phys, Krasnoyarsk 660036, Russia)
• Simunin M.M. (Russian Acad Sci, Siberian Branch, Krasnoyarsk Sci Ctr, Fed Res Ctr,FRC KSC SB RAS, Krasnoyarsk 660036, Russia; Siberian Fed Univ, Krasnoyarsk 660041, Russia; Reshetnev Univ, Reshetnev Siberian State Univ Sci & Technol, Krasnoyarsk 660037, Russia)
• Tambasov I.A. (Russian Acad Sci, Siberian Branch, Kirensky Inst Phys, Krasnoyarsk 660036, Russia)
• Karpova D.V. (Russian Acad Sci, Siberian Branch, Krasnoyarsk Sci Ctr, Fed Res Ctr,FRC KSC SB RAS, Krasnoyarsk 660036, Russia)
• Smolyarova T.E. (Siberian Fed Univ, Krasnoyarsk 660041, Russia; Russian Acad Sci, Siberian Branch, Kirensky Inst Phys, Krasnoyarsk 660036, Russia)
• Lukyanenko A.V. (Siberian Fed Univ, Krasnoyarsk 660041, Russia; Russian Acad Sci, Siberian Branch, Kirensky Inst Phys, Krasnoyarsk 660036, Russia)
• Karacharov A.A. (Russian Acad Sci, Siberian Branch, Inst Chem & Chem Technol, Krasnoyarsk 660036, Russia)
• Nemtsev I.V. (Russian Acad Sci, Siberian Branch, Krasnoyarsk Sci Ctr, Fed Res Ctr,FRC KSC SB RAS, Krasnoyarsk 660036, Russia; Siberian Fed Univ, Krasnoyarsk 660041, Russia; Russian Acad Sci, Siberian Branch, Kirensky Inst Phys, Krasnoyarsk 660036, Russia)
• Khartov S.V. (Russian Acad Sci, Siberian Branch, Krasnoyarsk Sci Ctr, Fed Res Ctr,FRC KSC SB RAS, Krasnoyarsk 660036, Russia)

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