Сибирский федеральный университет

Тип публикации: статья из журнала

Год издания: 1996

Аннотация: The electrical and structural properties of MexV1-xS (Me=Ti, Cr, Mn) solid solutions with x?0.1 are studied experimentally over 77-1300 K. Metal-dielectric transitions are observed for all these sulfides in the neighborhood of the reversible high-temperature endoeffect (Tc?800-900 K). At low temperatures (T300 K) these solid solutions have a minimum resistance at a temperature Tmin?150-260 K which depends on the composition of the sulfide and its thermal processing. © 1996 American Institute of Physics.

Журнал: Physics of the Solid State

Выпуск журнала: Vol. 38, Is. 4

Номера страниц: 562-564

• Petrakovskii G.A. (Krasnoyarsk State University)
• Mukoed G.M. (Krasnoyarsk State University)
• Loseva G.V. (L. V. Kirenskii Phys. Inst.,Siberian Branch,Russian Academy of Sciences)
• Kiselev N.I. (L. V. Kirenskii Phys. Inst.,Siberian Branch,Russian Academy of Sciences)
• Baranov A.V. (Institute of Mining)

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