Сибирский федеральный университет

Тип публикации: доклад, тезисы доклада, статья из сборника материалов конференций

Конференция: International Workshop on Advanced Technologies in Material Science, Mechanical and Automation Engineering - MIP: Engineering-2019; Krasnoyarsk; Krasnoyarsk

Год издания: 2019

Аннотация: In this paper, we investigate the problem of separation of a mixed production batch of semiconductor devices for the space industry into homogeneous production batches. The method of factor analysis is applied to reduce the dimensionality of the problem. We investigate the impact of measured parameters of semiconductor devices in the accuracy of the separation of the mixed lot, composed several homogeneous batches. It was shown, that with any orthogonal rotations of factor structure as the number of homogeneous batches in the sample increases, the clustering accuracy reduces. Groups of semiconductor device parameters which have the greatest impact on the partition accuracy regardless of the number of homogeneous batches in the sample detected.

Журнал: IOP Conference Series: Materials Science and Engineering

Выпуск журнала: 537

Номера страниц: 032088

Издатель: Institute of Physics Publishing

• Shkaberina G.S. (Reshetnev Siberian State University of Science and Technology)
• Orlov V.I. (Testing and Technical Center - NPO PM)
• Tovbis E.M. (Reshetnev Siberian State University of Science and Technology)
• Sugak E.V. (Reshetnev Siberian State University of Science and Technology)
• Kazakovtsev L.A. (Siberian Federal University)

• Ядро РИНЦ (eLIBRARY.RU)