Сибирский федеральный университет

Год издания: 2016

Идентификатор DOI: 10.1002/9781119069225.ch2-9

Журнал: Future Trends in Microelectronics: Journey into the Unknown

Номера страниц: 217-231

Издатель: Wiley

• Shlimak I. (Department of Physics and Faculty of Engineering,Jack and Pearl Institute of Advanced Technology,Bar Ilan University)
• Butenko A.V. (Department of Physics and Faculty of Engineering,Jack and Pearl Institute of Advanced Technology,Bar Ilan University)
• Zion E. (Department of Physics and Faculty of Engineering,Jack and Pearl Institute of Advanced Technology,Bar Ilan University)
• Richter V. (Department of Physics and Faculty of Engineering,Jack and Pearl Institute of Advanced Technology,Bar Ilan University)
• Kaganovskii Y. (Department of Physics and Faculty of Engineering,Jack and Pearl Institute of Advanced Technology,Bar Ilan University)
• Wolfson L. (Department of Physics and Faculty of Engineering,Jack and Pearl Institute of Advanced Technology,Bar Ilan University)
• Sharoni A. (Department of Physics and Faculty of Engineering,Jack and Pearl Institute of Advanced Technology,Bar Ilan University)
• Haran A. (Department of Physics and Faculty of Engineering,Jack and Pearl Institute of Advanced Technology,Bar Ilan University)
• Naveh D. (Department of Physics and Faculty of Engineering,Jack and Pearl Institute of Advanced Technology,Bar Ilan University)
• Kogan E. (Department of Physics and Faculty of Engineering,Jack and Pearl Institute of Advanced Technology,Bar Ilan University)
• Kaveh M. (Department of Physics and Faculty of Engineering,Jack and Pearl Institute of Advanced Technology,Bar Ilan University)

• РИНЦ (eLIBRARY.RU)
• Ядро РИНЦ (eLIBRARY.RU)