Тип публикации: доклад, тезисы доклада, статья из сборника материалов конференций
Конференция: International Siberian Conference on Control and Communications, SIBCON 2017; Astana; Astana
Год издания: 2017
Идентификатор DOI: 10.1109/SIBCON.2017.7998439
Ключевые слова: ATE, automated test equipment, HTE, intelligent devices, testing of complex multiparametric devices
Аннотация: This paper describes the structure and principles of automatic equipment for testing of complex multiparametric intelligent devices.
Издание
Журнал: 2017 International Siberian Conference on Control and Communications, SIBCON 2017 - Proceedings
Номера страниц: 7998439
Издатель: Institute of Electrical and Electronics Engineers Inc.
Персоны
- Gorchakovsky A. (Institute of Engineering Physic and Radio Electronics,Siberian Federal University)
- Evstratko V. (Institute of Engineering Physic and Radio Electronics,Siberian Federal University)
- Kamyshnikov A. (Institute of Engineering Physic and Radio Electronics,Siberian Federal University)
- Kamyshnikova A. (Institute of Engineering Physic and Radio Electronics,Siberian Federal University)
- Mishurov A. (Institute of Engineering Physic and Radio Electronics,Siberian Federal University)
- Sukhotin V. (Institute of Engineering Physic and Radio Electronics,Siberian Federal University)
- Panko S. (Military Engineering Institute,Siberian Federal University)
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